Company Filing History:
Years Active: 2004-2014
Title: Byeong-Ok Cho: Innovator in Structural Inspection and Thin Film Transistors
Introduction
Byeong-Ok Cho is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the fields of structural inspection and thin film transistors. With a total of 16 patents to his name, Cho has established himself as a key figure in technological innovation.
Latest Patents
Cho's latest patents include methods of inspecting structures and advancements in thin film transistors. The method for inspecting structures involves preparing preliminary spectrums of reference diffraction intensities based on critical dimensions of reference structures. This method includes obtaining a linear spectrum from the preliminary spectrums, radiating light to measurement structures on a substrate, measuring diffraction intensities, and determining critical dimensions from these measurements. His work on thin film transistors describes a transistor design that includes a gate electrode, gate insulation layer, and channel layer. The design optimizes the arrangement of source and drain lines to enhance performance, ensuring a high cut-off frequency.
Career Highlights
Throughout his career, Cho has worked with leading companies such as Samsung Electronics and Hyundai Electronics Industries. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in technology.
Collaborations
Cho has collaborated with notable professionals in his field, including Moon-Sook Lee and Takahiro Yasue. These collaborations have further enriched his work and expanded the impact of his inventions.
Conclusion
Byeong-Ok Cho's contributions to structural inspection and thin film transistors highlight his role as a significant innovator. His patents reflect a commitment to advancing technology and improving industry standards.