Company Filing History:
Years Active: 2006-2011
Title: Innovations of Boryau (Jack) Sheu: A Pioneer in Scan-Based Integrated Circuits
Introduction
Boryau (Jack) Sheu, located in San Jose, CA, is an accomplished inventor known for his significant contributions to the field of integrated circuit technology. With a total of 11 patents to his name, his work primarily focuses on enhancing the efficiency of scan-based integrated circuits, especially in terms of test data volume reduction and application time.
Latest Patents
Boryau's latest patents showcase his innovative methodologies and apparatuses, which provide efficient solutions for integrated circuits. One notable patent is for a "Method and apparatus for pipelined scan compression." This invention aims to reduce test data volume and application time without compromising the speed of scan chain operations during testing modes. It utilizes a decompressor with shift registers and a logic network to generate a decompressed scan pattern efficiently.
Another significant patent is the "Compacting test responses using X-driven compactor," which introduces an X-driven compactor designed to manage unknown values in scan-based integrated circuits. The device comprises a chain-switching matrix and a space compaction logic block, minimizing masking errors and enhancing the reliability of test responses.
Career Highlights
Boryau is currently employed at Syntest Technologies, Inc., where he continues to innovate and develop cutting-edge solutions for the integrated circuit industry. His consistent commitment to research and development has positioned him as a leader in the field, contributing to the advancement of testing methodologies for integrated electronics.
Collaborations
Throughout his career, Boryau has collaborated with esteemed colleagues such as Laung-Terng (L-T) Wang and Shianling Wu. These collaborations have fostered a creative environment that has led to several groundbreaking advancements in integrated circuit technology.
Conclusion
In summary, Boryau (Jack) Sheu’s work in scan-based integrated circuits has significant implications for the efficiency of electronic testing and reliability. His innovative patents and collaborative efforts underscore his role as a pivotal figure in the advancement of this essential technology. As the industry continues to evolve, his contributions will likely inspire future innovations in integrated circuit design and testing.