The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2010
Filed:
Sep. 07, 2007
Zhigang Wang, Sunnyvale, CA (US);
Laung-terng (L.-t.) Wang, Sunnyvale, CA (US);
Shianling Wu, Princeton Junction, NJ (US);
Xiaoqing Wen, Fukuoka, JP;
Boryau (Jack) Sheu, San Jose, CA (US);
Zhigang Jiang, San Jose, CA (US);
Zhigang Wang, Sunnyvale, CA (US);
Laung-Terng (L.-T.) Wang, Sunnyvale, CA (US);
Shianling Wu, Princeton Junction, NJ (US);
Xiaoqing Wen, Fukuoka, JP;
Boryau (Jack) Sheu, San Jose, CA (US);
Zhigang Jiang, San Jose, CA (US);
Syntest Technologies, Inc., Sunnyvale, CA (US);
Abstract
A method and apparatus for compacting test responses containing unknown values in a scan-based integrated circuit. The proposed X-driven compactor comprises a chain-switching matrix block and a space compaction logic block. The chain-switching matrix block switches the internal scan chain outputs before feeding them to the space compaction logic block for compaction so as to minimize X-induced masking and error masking. The X-driven compactor further selectively includes a finite-memory compaction logic block to further compact the outputs of the space compaction logic block.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile