The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2009
Filed:
Jul. 29, 2004
Laung-terng Wang, Sunnyvale, CA (US);
Khader S. Abdel-hafez, San Francisco, CA (US);
Xiaoqing Wen, Sunnyvale, CA (US);
Boryau (Jack) Sheu, San Jose, CA (US);
Fei-sheng Hsu, Hsinchu, TW;
Augusli Kifli, Hsinchu, TW;
Shyh-horng Lin, Taipei, TW;
Shianling Wu, Princeton Junction, NJ (US);
Shun-miin (Sam) Wang, San Jose, CA (US);
Ming-tung Chang, Changhua, TW;
Laung-Terng Wang, Sunnyvale, CA (US);
Khader S. Abdel-Hafez, San Francisco, CA (US);
Xiaoqing Wen, Sunnyvale, CA (US);
Boryau (Jack) Sheu, San Jose, CA (US);
Fei-Sheng Hsu, Hsinchu, TW;
Augusli Kifli, Hsinchu, TW;
Shyh-Horng Lin, Taipei, TW;
Shianling Wu, Princeton Junction, NJ (US);
Shun-Miin (Sam) Wang, San Jose, CA (US);
Ming-Tung Chang, Changhua, TW;
Syntest Technologies, Inc., Sunnyvale, CA (US);
Abstract
A method and apparatus time-division demultiplexes and decompresses a compressed input stimulus provided at a selected data rate R1, into a decompressed stimulus, driven at a selected data rate R2, for driving selected scan chains in a scan-based integrated circuit using a plurality of time-division demultiplexors and time-division multiplexors for shifting stimuli and test responses in and out of high-speed I/O pads in order to reduce test time, test cost, and scan pin count. A synthesis method is also proposed for synthesizing the time-division multiplexors, decompressors, compressors, and time-division multiplexors.