This inventor holds 38 USPTO granted patents and 5 published patent applications, primarily in DFT System Design. Top assignees: Syntest Technologies, Inc., Stardfx Technologies, Inc.. Active years: 2005-2017.
Company Filing History:
35 out of 55Â 
3 out of 3Â Years Active: 2005-2017
Areas of Expertise:
Title: Laung-Terng Wang: Innovator in Integrated Circuit Testing
Introduction
Laung-Terng Wang is a prolific inventor based in Sunnyvale, CA, who has made significant contributions to the field of integrated circuit testing. With a remarkable portfolio of 38 patents, Wang has developed innovative methods and apparatuses that enhance the efficiency and effectiveness of scan-based integrated circuits.
Latest Patents
Among his latest patents, Wang has created a "Method and apparatus for broadcasting scan patterns in a scan-based integrated circuit." This invention features a broadcaster, system, and method to reduce test data volume and application time in automatic test equipment (ATE). The scan-based integrated circuit includes multiple scan chains, each containing a series of scan cells. The broadcaster operates as a combinational logic network, controlled by a virtual scan controller, improving the testing of manufacturing faults. Additionally, methods for reordering scan cells and generating both broadcast and virtual scan patterns are proposed.
Another notable patent by Wang is titled "Multiple-capture DFT method for detecting or locating crossing clock-domain faults during self-test or scan-test." This method provides an innovative approach to detect and locate faults within multiple clock domains in an integrated circuit, ensuring that all clock domains are not triggered simultaneously during capture operations.
Career Highlights
Wang's career includes significant roles at Syntest Technologies, Inc. and Stardfx Technologies, Inc., where he harnessed his expertise in integrated circuit design and testing. His work has led to advancements that are invaluable to companies developing high-performance electronic systems.
Collaborations
Throughout his career, Wang has collaborated with notable colleagues, including Xiaoqing Wen and Po-Ching Hsu. Their collective efforts in the field of integrated circuits have contributed to significant innovations and advancements in testing methodologies.
Conclusion
Laung-Terng Wang's contributions to the field of integrated circuits have established him as a key figure in innovation and testing technologies. His extensive patent portfolio showcases his commitment to improving the reliability and efficiency of electronic systems, solidifying his impact as an inventor in the industry.