Ming-Tung Chang

Title: Innovations of Ming-Tung Chang

Introduction

Ming-Tung Chang is a notable inventor based in Changhua, Taiwan. He has made significant contributions to the field of integrated circuits, holding a total of four patents. His work focuses on enhancing the efficiency and effectiveness of testing methodologies in scan-based integrated circuits.

Latest Patents

One of his latest patents is titled "Method and apparatus for shifting at-speed scan patterns in a scan-based integrated circuit." This invention provides a method and apparatus that time-division demultiplexes and decompresses a compressed input stimulus at a selected data rate. It drives selected scan chains in a scan-based integrated circuit using multiple time-division demultiplexors and multiplexors. This innovation aims to reduce test time, test cost, and scan pin count. Another significant patent is "Method and apparatus for unifying self-test with scan-test during prototype debug and production test." This invention utilizes a unified test controller to facilitate testing and diagnosing faults in scan-based integrated circuits. It allows for at-speed or reduced-speed self-test within each clock domain, enabling designers to effectively address various types of faults.

Career Highlights

Ming-Tung Chang is currently employed at Syntest Technologies, Inc., where he continues to develop innovative solutions in the field of integrated circuit testing. His expertise and inventions have contributed to advancements in design-for-test methodologies.

Collaborations

Ming-Tung has collaborated with notable colleagues such as Xiaoqing Wen and Shyh-Horng Lin, further enhancing the impact of his work in the industry.

Conclusion

Ming-Tung Chang's contributions to integrated circuit testing through his innovative patents demonstrate his commitment to advancing technology in this field. His work continues to influence the efficiency of testing methodologies, making significant strides in the industry.