Lincoln, NE, United States of America

Blaine R Spady


Average Co-Inventor Count = 3.2

ph-index = 7

Forward Citations = 127(Granted Patents)


Location History:

  • San Jose, CA (US) (2001)
  • Lincoln, NE (US) (2004 - 2007)

Company Filing History:


Years Active: 2001-2007

Loading Chart...
10 patents (USPTO):Explore Patents

Title: Celebrating the Innovations of Inventor Blaine R. Spady

Introduction: Blaine R. Spady, an accomplished inventor based in Lincoln, NE, has made significant strides in metrology and inspection systems, holding a total of ten patents to her name. Her innovative spirit and dedication to advancing technology have made substantial contributions to the field, particularly in the manufacturing of semiconductor wafers.

Latest Patents: Blaine R. Spady's latest innovations include a cutting-edge metrology/inspection positioning system. This system revolutionizes the traditional approach by moving imaging and measuring equipment relative to a stationary wafer, thus eliminating the need for the wafer to be mounted on precision stages. This allows for seamless measurement or inspection directly on the wafer, which can remain in its processing apparatus, saving time and resources during fabrication processes. The alignment of the optical system is enhanced through edge detection and image recognition technologies. Additionally, her development of a control system in image rotation ensures that the orientation of the wafer's features remains consistent across varying inspection areas.

Career Highlights: Throughout her career at Nanometrics Inc., Blaine has demonstrated exceptional ingenuity and technical expertise. Her patents reflect her commitment to improving the efficiency and accuracy of wafer inspection processes, which are critical in the semiconductor manufacturing industry. Blaine's work is characterized by her focus on integrating advanced technology with practical applications.

Collaborations: Blaine R. Spady’s journey is marked by valuable collaborations with her coworkers, including Richard A. Yarussi and John D. Heaton. These partnerships have facilitated the exchange of ideas and the pooling of expertise, further enriching the innovative output of their team at Nanometrics Inc.

Conclusion: Blaine R. Spady stands out as a prominent inventor whose work continues to influence the field of metrology and inspection. Her dedication to innovation and collaboration has not only advanced her career but has also contributed significantly to the semiconductor industry. With ten patents to her credit, Blaine's legacy as an inventor is firmly established, and her future endeavors hold great promise for further advancements in technology.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…