Berlin, Germany

Bernd Srocka

This inventor holds 11 USPTO granted patents and 1 published patent application and 7 EPO patents. Top assignees: Hseb Dresden Gmbh, Accent Optical Technologies Nanometrics, Inc., Aoti Operating Company, Inc. Active years: 2003-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bernd Srocka. Retrieved from https://idiyas.com/inventor/bernd-srocka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 11 

% Patents Active = 72.7

 

Average Co-Inventor Count = 1.5

ph-index = 3

Forward Citations = 34(Granted Patents)


Company Filing History:


Years Active: 2003-2018

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11 patents (USPTO):Explore Patents

Title: Bernd Srocka: Innovator in Optical Measurement Technologies

Introduction

Bernd Srocka is a prominent inventor based in Berlin, Germany. He has made significant contributions to the field of optical measurement technologies, holding a total of 11 patents. His innovative methods and assemblies have advanced the way thickness and height profiles of layers and surfaces are measured.

Latest Patents

One of Bernd Srocka's latest patents is a method and assembly for determining the thickness of a layer in a sample stack. This invention influences the intensity of reflected light from a light source. The thickness is determined from the intensity detected by an array detector with multiple detector elements arranged in lines and columns. The detector comprises several sections in the form of parallel stripes, which detect the light reflected by the sample stack of layers simultaneously. Each section of the detector is designed to detect light of a selected wavelength range only. The image of the sample stack on the detector is moved in a direction perpendicular to the longitudinal direction of the parallel stripes, ensuring that each point of the sample stack is detected at least once in each of the different wavelength ranges.

Another notable patent is a measurement method for height profiles of surfaces using a differential interference contrast image. This method allows for the optical measurement of height profiles, where an image of the height profile is recorded using an optical recording system. The image is characterized by differential interference contrast, and height gradients within the profile are represented by intensity gradients, which can be quantitatively or qualitatively evaluated. This method is particularly useful for surfaces with defined profiles, where intensity gradients indicate potential defects.

Career Highlights

Throughout his career, Bernd Srocka has worked with several notable companies, including HSEB Dresden GmbH and Accent Optical Technologies Nanometrics, Inc. His work in these organizations has contributed to the development of advanced optical measurement technologies.

Collaborations

Bernd has collaborated with several professionals in his field, including Ralf Langhans and Marko Döring. These collaborations have further enhanced his innovative contributions to optical measurement.

Conclusion

Bernd Srocka is a distinguished inventor whose work in optical measurement technologies has led to significant advancements in the field. His numerous patents reflect his commitment to innovation and excellence in measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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