The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2003

Filed:

Apr. 18, 2001
Applicant:
Inventors:

Benno Orschel, Salem, OR (US);

Jan Helm, Berlin, DE;

Bernd Srocka, Berlin, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/125 ;
U.S. Cl.
CPC ...
G01N 2/125 ;
Abstract

For determining the dependence of a first measuring quantity (Y) on a second measuring quantity (P) the second measuring quantity (P) is periodically modified with a frequency (f ). The first measuring quantity (Y) changing accordingly is measured. From the obtained measuring signal of the first measuring quantity (Y) the components of the first measuring quantity (Y) are determined with at least a plurality of frequencies. From the components thus determined the first measuring quantity (Y) is reconstructed for at least a plurality of values of the second measuring quantity (P) by signal processing.


Find Patent Forward Citations

Loading…