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For the Inventor, By the Inventor

Westlake Village, CA, United States of America

Benjamin J Brown

USPTO Granted Patents = 12

Average Co-Inventor Count = 2.6

ph-index = 9

Forward Citations = 157(Granted Patents)


Location History:

  • Westlake Village, CA (US) (1993 - 2001)
  • Lake Oswego, OR (US) (1999 - 2006)

Company Filing History:

goldMedal11 out of 720 
 
Teradyne, Inc.
 patents
silverMedal1 out of 832,912 
Other
 patents

Years Active: 1993-2006

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12 patents (USPTO):Explore Patents
1. 6990423 - Apparatus and method for testing non-deterministic device data (2006-01-24),
2. 6609077 - ATE timing measurement unit and method (2003-08-19),
3. 6360340 - Memory tester with data compression (2002-03-19),
4. 6286120 - Memory architecture for automatic test equipment using vector module table (2001-09-04),
5. 6188253 - Analog clock module (2001-02-13),
6. 5923675 - Semiconductor tester for testing devices with embedded memory (1999-07-13),
7. 5570383 - Timing hazard detector accelerator (1996-10-29),
8. 5566188 - Low cost timing generator for automatic test equipment operating at high (1996-10-15),
9. 5321702 - High speed timing generator (1994-06-14),
10. 5321700 - High speed timing generator (1994-06-14),
11. 5280486 - High speed fail processor (1994-01-18),
12. 5270582 - High speed timing generator (1993-12-14),

Title: The Innovations of Benjamin J Brown

Introduction

Benjamin J Brown is a notable inventor based in Westlake Village, CA. He holds a total of 12 patents that showcase his contributions to the field of automatic test equipment and semiconductor testing. His work has significantly impacted the way non-deterministic device data is tested and validated.

Latest Patents

Among his latest patents is the "Apparatus and method for testing non-deterministic device data." This invention involves automatic test equipment designed to test non-deterministic packet data from a device-under-test. The equipment includes a memory for storing expected packet data and a receiver for receiving the packet data from the device. A data validation circuit is integrated to validate the non-deterministic packet data based on the expected data from the memory.

Another significant patent is the "ATE timing measurement unit and method." This invention pertains to automatic test equipment for testing semiconductor devices. It includes a computer workstation and pin electronics circuitry that connects the semiconductor device to the computer. The circuitry features multiple channels, each equipped with timing circuitry that responds to programmed timing information. This setup allows for real-time timing measurement data to be produced in parallel.

Career Highlights

Throughout his career, Benjamin has worked with prominent companies, including Teradyne, Inc. His experience in the industry has allowed him to develop innovative solutions that enhance testing processes for semiconductor devices.

Collaborations

Benjamin has collaborated with notable individuals in his field, including Peter A Reichert and John Robert Pane. Their combined expertise has contributed to the advancement of technology in automatic testing.

Conclusion

Benjamin J Brown's contributions to the field of automatic test equipment and semiconductor testing are noteworthy. His innovative patents and collaborations have paved the way for advancements in testing methodologies. His work continues to influence the industry and inspire future innovations.

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