The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 18, 1994

Filed:

Feb. 08, 1993
Applicant:
Inventors:

Brian J Arkin, Simi Valley, CA (US);

Benjamin J Brown, Westlake Village, CA (US);

Peter A Reichert, Newbury Park, CA (US);

Assignee:

Teradyne, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 291 ; 371 165 ; 371 216 ; 371 226 ;
Abstract

An apparatus for processing failure information received from a node of a circuit under test. The apparatus includes a fail processor which receives test data from a node and generates failure data based upon the test data, a plurality of fail memories, each memory being configured to receive and store certain fail data, and a sequence memory configured-to store sequence information indicating in what order the failure data is stored in the plurality of fail memories.


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