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For the Inventor, By the Inventor

North Reading, MA, United States of America

Teradyne, Inc.


USPTO Granted Patents = 729

% Expired Patents = 10.6



Trademarks = 14

Forward Citations = 15,514

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605 inventors (with patents filed for the assignee):

goldMedal Brian S Merrow (36 out of 36 patents)

silverMedal Philip T Stokoe (27 out of 45 patents)

bronzeMedal Thomas S Cohen (25 out of 89 patents)

4.  Eric Lenhart Truebenbach (24 out of 24 patents)

5.  Ronald A Sartschev (24 out of 24 patents)

6.  Peter A Reichert (21 out of 21 patents)

7.  George W Conner (20 out of 24 patents)

8.  Mark W Gailus (18 out of 136 patents)

9.  Tushar K Gohel (17 out of 17 patents)

10.  Fang Xu (16 out of 20 patents)

11.  Evgeny Polyakov (16 out of 16 patents)

12.  Frank Parrish (16 out of 17 patents)

13.  Ernest P Walker (16 out of 18 patents)

14.  Sepehr Kiani (14 out of 57 patents)

15.  Joseph Francis Wrinn (13 out of 13 patents)


Core Competencies:
Automated Test Equipment
Robotic Control
Optical Alignment
Voltage Driver Circuit
Test Socket
Probe Card Assembly
Thermal Control
Signal Path Measurement
Device Testing
Calibration Process
Waveguide Connector
Logistics Management

729 patents:

1. 12710463 - ANALYZING BUNDLES OF WIRES (2026-08-18),
2. 12699008 - Test systems configured to test devices at different temperatures (2026-08-04),
3. 12648082 - Circuit board having an edge containing conductive regions (2026-06-02),
4. 12591007 - Determining a correlation between power disturbances and data errors in a test system (2026-03-31),
5. 12540845 - System for testing light sources (2026-02-03),
6. 12538434 - Flattening a circuit board assembly using vacuum pressure (2026-01-27),
7. 12535523 - Optical alignment in a test system (2026-01-27),
8. 12504463 - Electrical isolation circuitry (2025-12-23),
9. 12504459 - Injecting vibrations to detect a fault in a transmission line (2025-12-23),
10. 12461141 - Identifying failures in device cores (2025-11-04),
11. 12313683 - Controlling storage of test data based on prior test program execution (2025-05-27),
12. 12287151 - Thermal plate having a fluid channel (2025-04-29),
13. 12235317 - Test system that converts command syntaxes (2025-02-25),
14. 12050244 - Method for reduction of SIC MOSFET gate voltage glitches (2024-07-30),
15. 12046787 - Waveguide connector for connecting first and second waveguides, where the connector includes a male part, a female part and a self-alignment feature and a test system formed therefrom (2024-07-23),
Teradyne, Inc., headquartered in North Reading, Massachusetts, specializes in automated test systems that ensure the reliability and performance of electronic devices. The company develops advanced automated test equipment and robotic control solutions, focusing on critical areas such as optical alignment, voltage driver circuits, and thermal control. Teradyne's innovations extend to test socket and probe card assembly, as well as signal path measurement, catering to a diverse range of industries including semiconductor, automotive, and consumer electronics.
Profile summary based on public USPTO records.

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USPTO Data Jan 1 1976 - Sep 29 2026

Teradyne, Inc.
729 Patents

#1 in North Reading, MA

#38 in Massachusetts

#690 in US

#1,363 in the World

North Reading, MA (US)
North Reading, MA, United States of America

Teradyne, Inc.

Forward Citations = 15,514

605 inventors:

goldMedal Brian S Merrow (36 out of 36 patents)

silverMedal Philip T Stokoe (27 out of 45 patents)

bronzeMedal Thomas S Cohen (25 out of 89 patents)

4.  Eric Lenhart Truebenbach (24 out of 24 patents)

5.  Ronald A Sartschev (24 out of 24 patents)

Please report any incorrect information to [email protected]
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