The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2006

Filed:

Jun. 25, 2003
Applicants:

Benjamin Brown, Lake Oswego, OR (US);

Peter Huber, Waltham, MA (US);

Mark Donahue, Sherwood, OR (US);

John Pane, Tigard, OR (US);

Inventors:

Benjamin Brown, Lake Oswego, OR (US);

Peter Huber, Waltham, MA (US);

Mark Donahue, Sherwood, OR (US);

John Pane, Tigard, OR (US);

Assignee:

Teradyne, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Automatic test equipment for testing non-deterministic packet data from a device-under-test is disclosed. The automatic test equipment includes a memory for storing expected packet data and a receiver for receiving the packet data from the device-under-test. A data validation circuit is coupled to the receiver for validating non-deterministic packet data based on the expected packet data from the vector memory.


Find Patent Forward Citations

Brown, Benjamin. (2006). Apparatus and method for testing non-deterministic device data (U.S. Patent No. 6990423). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6990423

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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