Company Filing History:
Years Active: 2006-2015
Title: Mark B Donahue: Innovator in Device Testing Technologies
Introduction
Mark B Donahue is a notable inventor based in Sherwood, Oregon. He has made significant contributions to the field of automatic test systems, holding 2 patents that enhance the efficiency and effectiveness of device testing.
Latest Patents
One of his latest patents is titled "Method and apparatus for device testing using multiple processing paths." This invention provides a method for operating an automatic test system that utilizes multiple paths programmed with a test pattern. The method involves executing vectors in the test pattern with circuitry that comprises several paths. It allows for processing in a first path, which can generate a branch in the flow of execution to a non-sequential location in the test pattern. The system then initiates processing from this non-sequential location in a second path. Another significant patent is "Apparatus and method for testing non-deterministic device data." This invention discloses automatic test equipment designed to test non-deterministic packet data from a device-under-test. It includes a memory for storing expected packet data and a receiver for receiving the packet data from the device-under-test, along with a data validation circuit for validating the received data.
Career Highlights
Mark B Donahue is currently employed at Teradyne, Inc., where he continues to innovate in the field of device testing. His work focuses on developing advanced testing methodologies that improve the reliability and accuracy of electronic devices.
Collaborations
Throughout his career, Mark has collaborated with talented individuals such as John Robert Pane and Benjamin J Brown. These collaborations have contributed to the development of cutting-edge technologies in the testing domain.
Conclusion
Mark B Donahue is a distinguished inventor whose work in device testing technologies has made a significant impact on the industry. His innovative patents and contributions continue to shape the future of automatic testing systems.