This inventor holds 1 USPTO granted patent. Top assignee: Teradyne, Inc.. Active years: 2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006
Title: The Innovations of Peter Huber
Introduction
Peter Huber is an accomplished inventor based in Waltham, MA (US). He has made significant contributions to the field of automatic test equipment, particularly in the area of testing non-deterministic device data. His innovative approach has led to the development of a patented technology that enhances the efficiency and accuracy of data validation processes.
Latest Patents
Peter Huber holds a patent for an "Apparatus and method for testing non-deterministic device data." This invention focuses on automatic test equipment designed to test non-deterministic packet data from a device-under-test. The equipment includes a memory for storing expected packet data and a receiver for receiving the packet data from the device-under-test. A data validation circuit is integrated with the receiver to validate non-deterministic packet data based on the expected packet data from the vector memory. This innovation represents a significant advancement in the field of testing technology.
Career Highlights
Peter Huber is currently employed at Teradyne, Inc., a leading company in the field of automatic test equipment. His work at Teradyne has allowed him to collaborate with other talented professionals, including Benjamin J. Brown and Mark B. Donahue. Together, they contribute to the development of cutting-edge technologies that improve testing processes across various industries.
Collaborations
Due to space constraints, the details of collaborations will not be included.
Conclusion
Peter Huber's contributions to the field of automatic test equipment through his innovative patent demonstrate his expertise and commitment to advancing technology. His work continues to impact the industry positively, showcasing the importance of innovation in testing methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
