The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2002
Filed:
Nov. 19, 1996
Benjamin J. Brown, Lake Oswego, OR (US);
Robert B. Gage, Beaverton, OR (US);
John F. Donaldson, Thousand Oaks, CA (US);
Alexander Joffe, Thousand Oaks, CA (US);
Teradyne, Inc., Boston, MA (US);
Abstract
A semiconductor memory test system with improved fault data processing and display capabilities. The memory tester includes a lossless data compressor for failure data. Compression allows failure data to be more rapidly transferred to a display device that is part of a work station controlling the memory tester. It also reduces the amount of data that must be stored in the display memory, thereby providing a cost effective way to store data from multiple tests. By allowing data for multiple tests to be stored, the data from a prior test can be used to control the formatting of data for a subsequent test. Such formatting is useful for such things as observing failure mechanisms as the operating temperature or speed of the semiconductor memory under test increases.