Thousand Oaks, CA, United States of America

John F Donaldson

This inventor holds 2 USPTO granted patents. Top assignee: Teradyne, Inc.. Active years: 1999-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: John F Donaldson. Retrieved from https://idiyas.com/inventor/john-f-donaldson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 2

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 1999-2002

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2 patents (USPTO):Explore Patents

Title: Innovations by John F. Donaldson

Introduction

John F. Donaldson is a notable inventor based in Thousand Oaks, CA (US). He has made significant contributions to the field of semiconductor testing, holding a total of 2 patents. His work focuses on improving the efficiency and effectiveness of memory testing systems.

Latest Patents

One of his latest patents is a memory tester with data compression. This semiconductor memory test system enhances fault data processing and display capabilities. The memory tester incorporates a lossless data compressor for failure data, allowing for rapid data transfer to a display device. This innovation reduces the amount of data that must be stored in the display memory, providing a cost-effective solution for storing data from multiple tests. By enabling the storage of data from prior tests, it facilitates better formatting for subsequent tests, which is particularly useful for observing failure mechanisms as operating conditions change.

Another significant patent is a semiconductor tester designed for testing devices with embedded memory. This tester features circuitry that allows for algorithmic test generation, which can be used alongside scan test structures of semiconductor devices. The inclusion of an algorithmic pattern generator significantly reduces programming and debugging time. Additionally, the tester features serializer circuits that convert the generated test patterns into serial bit streams, making it useful for scan testing embedded memories.

Career Highlights

John F. Donaldson is currently employed at Teradyne, Inc., where he continues to innovate in the field of semiconductor testing. His work has had a profound impact on the efficiency of memory testing processes.

Collaborations

He has collaborated with notable coworkers such as Benjamin J. Brown and Kurt B. Gusinow, contributing to advancements in semiconductor technology.

Conclusion

John F. Donaldson's contributions to semiconductor testing through his innovative patents demonstrate his expertise and commitment to advancing technology. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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