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For the Inventor, By the Inventor

Santa Clara, CA, United States of America

Antonio Arion Gellineau

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This inventor holds 21 USPTO granted patents and 3 published patent applications and 1 EPO patent, primarily in Semiconductor Metrology. Top assignees: Kla Tencor Corporation, Kla Corporation. Active years: 2019-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Antonio Arion Gellineau. Retrieved from https://idiyas.com/inventor/antonio-arion-gellineau

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 21 

% Patents Active = 95.2

 

Average Co-Inventor Count = 3.2

ph-index = 4

Forward Citations = 128(Granted Patents)


Company Filing History:

goldMedal13 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal8 out of 619 
 
Kla Corporation
 patents

Years Active: 2019-2025

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Areas of Expertise:
X-Ray Scatterometry
Semiconductor Measurement
Parameter Estimation
Process Monitoring
Full Beam Metrology
High Aspect Ratio Structures
Real Time Measurement Control
Calibration Techniques
Visualization Techniques
Deep Structures
Multilayer Targets
Spatial Resolution
21 patents (USPTO):Explore Patents
1. 12360062 - Methods and systems for regularizing the optimization of application specific semiconductor measurement system parameter settings (2025-07-15),
2. 12320763 - Full beam metrology for x-ray scatterometry systems (2025-06-03),
3. 12019030 - Methods and systems for targeted monitoring of semiconductor measurement quality (2024-06-25),
4. 11990380 - Methods and systems for combining x-ray metrology data sets to improve parameter estimation (2024-05-21),
5. 11955391 - Process monitoring of deep structures with X-ray scatterometry (2024-04-09),
6. 11698251 - Methods and systems for overlay measurement based on soft X-ray Scatterometry (2023-07-11),
7. 11519869 - Methods and systems for real time measurement control (2022-12-06),
8. 11519719 - Transmission small-angle X-ray scattering metrology system (2022-12-06),
9. 11313816 - Full beam metrology for x-ray scatterometry systems (2022-04-26),
10. 11145559 - Process monitoring of deep structures with X-ray scatterometry (2021-10-12),
11. 11099137 - Visualization of three-dimensional semiconductor structures (2021-08-24),
12. 11073487 - Methods and systems for characterization of an x-ray beam with high spatial resolution (2021-07-27),
13. 10983227 - On-device metrology using target decomposition (2021-04-20),
14. 10816486 - Multilayer targets for calibration and alignment of X-ray based measurement systems (2020-10-27),
15. 10794839 - Visualization of three-dimensional semiconductor structures (2020-10-06),

Title: Antonio Arion Gellineau - Pioneering Inventor from Santa Clara

Introduction: Antonio Arion Gellineau is a distinguished inventor based in Santa Clara, California, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Antonio Arion Gellineau holds several patents in the areas of artificial intelligence, machine learning, and robotics, showcasing his expertise in cutting-edge technologies.

Career Highlights: With a career spanning over two decades, Antonio Arion Gellineau has worked with leading tech companies, spearheading projects that have revolutionized the industry. His innovative solutions have garnered international recognition.

Collaborations: Throughout his career, Antonio Arion Gellineau has collaborated with top researchers, engineers, and scientists, fostering a culture of innovation and excellence. His collaborative efforts have led to the development of transformative technologies.

Conclusion: Antonio Arion Gellineau's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and engineers. His impact on the tech industry is truly remarkable.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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