Anne Meixner

Title: The Innovations of Anne Meixner

Introduction

Anne Meixner is a prominent inventor based in Portland, OR (US). She has made significant contributions to the field of technology, particularly in the area of integrated circuits and testing methods. With a total of 3 patents to her name, her work has had a notable impact on the industry.

Latest Patents

One of her latest patents is titled "Leakage testing for differential signal transceiver." This method involves providing a device under test (DUT) that has an input port and an output port. The DUT includes a squelch detector that receives a signal from the input port, as well as a receiver amplifier and a transmitter for data signals. The method also incorporates a loopback connection from the output port to the differential input port, allowing for the monitoring of outputs to determine any leakage conditions in the DUT.

Another significant patent is the "Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elements." This invention features an integrated circuit with multiple input/output (I/O) buffers, each containing an I/O test circuit that generates test pattern signals during loopback test mode. The circuit also includes programmable delay circuits that facilitate switching state loopback timing tests.

Career Highlights

Anne Meixner is currently employed at Intel Corporation, where she continues to innovate and develop new technologies. Her work at Intel has positioned her as a key player in advancing integrated circuit testing methods.

Collaborations

Some of her notable coworkers include Sarah E Bates and R Tim Frodsham, with whom she collaborates on various projects within the company.

Conclusion

Anne Meixner's contributions to technology through her patents and work at Intel Corporation highlight her role as an influential inventor in the field. Her innovative methods for testing integrated circuits are paving the way for advancements in technology.