The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 1996

Filed:

Sep. 15, 1995
Applicant:
Inventors:

Jashojiban Banik, Aloha, OR (US);

Anne Meixner, Aloha, OR (US);

Glenn F King, Aloha, OR (US);

Doug Guddat, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ; G11C / ;
U.S. Cl.
CPC ...
365201 ; 365203 ; 365204 ; 365205 ; 371 211 ;
Abstract

A test circuit and method for testing a memory cell in a static random access memory. The memory cell is coupled to a bit line and a complementary bit line. The test circuit includes a charging device coupled to selectively charge one of the bit line or the complementary bit line and a discharging device coupled to selectively discharge the other of the bit line and the complementary bit line. To test a memory cell containing the first value, the test circuit performs a weak write of the second value to the memory cell. The weak write overwrites the first value contained in the memory cell with the second value if the memory cell is defective. The memory cell retains the first value if functioning properly.


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