The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 2006

Filed:

Jun. 29, 2004
Applicants:

Eric R. Wehage, Tenino, WA (US);

Anne Meixner, Portland, OR (US);

Kersi H. Vakil, Olympia, WA (US);

Inventors:

Eric R. Wehage, Tenino, WA (US);

Anne Meixner, Portland, OR (US);

Kersi H. Vakil, Olympia, WA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method includes providing a device under test (DUT) which has an input port and an output port. The DUT also has a squelch detector which is coupled to receive a signal from the input port. The DUT also has a receiver amplifier coupled to receive a signal from the input port. In addition, the DUT also has a transmitter to transmit data signals from the output port. The method further includes providing a loopback connection from the output port to the differential input port. The method also includes controlling the transmitter to transmit a test signal from the output port to the input port. The method includes monitoring at least one of respective outputs of the receiver amplifier and the squelch detector to determine whether a leakage condition exists in the DUT. Other embodiments are described and claimed.


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