Amanda Renee Kaufer

This inventor holds 31 USPTO granted patents and 1 published patent application, primarily in Integrated Circuit Testing. Top assignees: International Business Machines Corporation, Globalfoundries Inc.. Active years: 2013-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Amanda Renee Kaufer. Retrieved from https://idiyas.com/inventor/amanda-renee-kaufer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 31 (Patent Applications = 1)

% Patents Active = 9.7

Average Co-Inventor Count = 3.7

ph-index = 5

Forward Citations = 48(Granted Patents)

Location History:

Rochester, MN (US) (2013 - 2019)
Hopewell Junction, NY (US) (2019)

Company Filing History:

29 out of 166,351

International Business Machines Corporation

Years Active: 2013-2019

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Areas of Expertise:

OPMISR

LBIST

Scan Diagnostics

Test Coverage

Pattern Generation

Redundancy Repair

Failure Diagnostics

Boundary Scan

Self-Test

Integrated Circuits

Hierarchical LFSRs

Test Vector Spreading

31 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 10379159 - Minimization of over-masking in an on product multiple input signature register (OPMISR) (2019-08-13),

2. 10372853 - Implementing enhanced diagnostics with intelligent pattern combination in automatic test pattern generation (ATPG) (2019-08-06),

3. 10371749 - Removal of over-masking in an on product multiple input signature register (OPMISR) test (2019-08-06),

4. 10359471 - Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through scan skewing (2019-07-23),

5. 10345380 - Implementing over-masking removal in an on product multiple input signature register (OPMISR) test due to common channel mask scan registers (CMSR) loading (2019-07-09),

6. 10234507 - Implementing register array (RA) repair using LBIST (2019-03-19),

7. 10060978 - Implementing prioritized compressed failure defects for efficient scan diagnostics (2018-08-28),

8. 10024917 - Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through spreading in stumpmux daisy-chain structure (2018-07-17),

9. 10024914 - Diagnosing failure locations of an integrated circuit with logic built-in self-test (2018-07-17),

10. 9964591 - Implementing decreased scan data interdependence in on product multiple input signature register (OPMISR) through PRPG control rotation (2018-05-08),

11. 9568549 - Managing redundancy repair using boundary scans (2017-02-14),

12. 9557383 - Partitioned scan chain diagnostics using multiple bypass structures and injection points (2017-01-31),

13. 9551747 - Inserting bypass structures at tap points to reduce latch dependency during scan testing (2017-01-24),

14. 9547039 - Inserting bypass structures at tap points to reduce latch dependency during scan testing (2017-01-17),

15. 9529046 - Partitioned scan chain diagnostics using multiple bypass structures and injection points (2016-12-27),

Title: **Amanda Renee Kaufer: Innovator in Enhanced Scan Data Testing**

Introduction

Amanda Renee Kaufer is an accomplished inventor based in Rochester, MN, USA, known for her significant contributions to the field of electronic design automation and testing. With an impressive portfolio of 31 patents, Amanda has been at the forefront of developing innovative solutions aimed at improving testing methodologies in integrated circuit design.

Latest Patents

Among Amanda's most recent inventions is a breakthrough in the minimization of over-masking in an on-product multiple input signature register (OPMISR). This patent outlines a method and circuit that facilitate enhanced scan data testing by addressing the challenges associated with Channel Mask Enable (CME) sharing. The design utilizes common Channel Mask Scan Registers (CMSR) logic alongside a multiple input signature register (MISR), incorporating individual local addressing to enhance test pattern effectiveness. Another notable patent focuses on the removal of over-masking in OPMISR tests, employing a test algorithm control that allows for sharing of CMSR data while effectively managing the CME pins. These innovations are instrumental in advancing the capability of scan data testing.

Career Highlights

Amanda has held pivotal roles at renowned companies including IBM and Globalfoundries Inc., where she has contributed her expertise in circuit design and testing methodologies. Her work has not only propelled her professional growth but also significantly impacted the technologies utilized in the industry today.

Collaborations

Throughout her career, Amanda has collaborated with notable professionals such as Steven Michael Douskey and Michael John Hamilton. These partnerships have enriched her knowledge and broadened her approach to solving complex problems within her field.

Conclusion

Amanda Renee Kaufer's commitment to innovation in electronic testing is evident through her impressive patent portfolio and her contributions to industry-leading companies. Her ongoing research and inventions continue to pave the way for advancements in integrated circuit testing, solidifying her position as a prominent inventor in the field.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent pending: