The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Apr. 26, 2017
International Business Machines Corporation, Armonk, NY (US);
Steven M. Douskey, Rochester, MN (US);
Michael J. Hamilton, Rochester, MN (US);
Amanda R. Kaufer, Rochester, MN (US);
Phillip A. Senum, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and circuit for implementing enhanced scan data testing with decreased scan data interdependence for compressed patterns in On Product Multiple Input Signature Register (OPMISR) testing through spreading in a stump mux data chain structure, and a design structure on which the subject circuit resides are provided. The stump mux chain structure includes a plurality of stump muxes connected in series by a respective rotation function. A respective exclusive OR (XOR) spreading function included with each of the plurality of stump muxes provides channel inputs. XOR inputs are applied to each XOR spreading function providing unique input combinations for each respective channel included with each of said plurality of stump muxes. The respective rotation function enables test data to be rotated as scan data enters each stump mux to further make the test data unique for each stump mux.