The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2018
Filed:
Apr. 19, 2016
International Business Machines Corporation, Armonk, NY (US);
Steven M. Douskey, Rochester, MN (US);
Michael J. Hamilton, Rochester, MN (US);
Amanda R. Kaufer, Rochester, MN (US);
Phillip A. Senum, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and circuit are provided for implementing enhanced scan data testing for test time reduction and decreased scan data interdependence with on product multiple input signature register (OPMISR++) testing, and a design structure on which the subject circuit resides. A respective Pseudo-Random Pattern Generator (PRPG) provides channel input patterns to a respective associated scan channel used for the OPMISR++ diagnostics. Control inputs are coupled to the Pseudo-Random Pattern Generator (PRPG) providing PRPG control distribution. The PRPG selectively provides controlled channel input patterns for the respective scan channel responsive to the control inputs.