The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2019
Filed:
Jul. 31, 2018
International Business Machines Corporation, Armonk, NY (US);
Steven M. Douskey, Rochester, MN (US);
Michael J. Hamilton, Rochester, MN (US);
Amanda R. Kaufer, Rochester, MN (US);
Matthew B. Schallhorn, Greensboro, NC (US);
Mary P. Kusko, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and circuit are provided for implementing enhanced scan data testing with minimization of over masking in an on product multiple input signature register (OPMISR) test due to Channel Mask Enable (CME) sharing, and a design structure on which the subject circuit resides. A common Channel Mask Scan Registers (CMSR) logic is used with a multiple input signature register (MISR). Individual local addressing is used for implementing enhanced scan data testing. An architecture and algorithm efficiently expand and target the use of the CME pins to minimize over-masking, to increase test pattern effectiveness with the use of individual local addressing.