The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2019
Filed:
Feb. 02, 2018
International Business Machines Corporation, Armonk, NY (US);
Steven M. Douskey, Rochester, MN (US);
Matthew B. Schallhorn, Greensboro, NC (US);
Mary P. Kusko, Hopewell Junction, NY (US);
Amanda R. Kaufer, Rochester, MN (US);
Michael J. Hamilton, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and circuit are provided for implementing enhanced scan data testing with over masking removal in an on product multiple input signature register plus (OPMISR+) test due to common Channel Mask Scan Registers (CMSRs) loading, and a design structure on which the subject circuit resides. An OPMISR plus satellite includes a multiple input signature register (MISR) for data collection and a plurality of associated scan channels. A common Channel Mask Scan Registers (CMSR) logic is used with the multiple input signature register (MISR). Unique CMSR data is loaded into at least one OPMISR plus satellite for implementing enhanced scan data testing. Scan pausing is used to reduce the amount of CMSR scan load data by loading the unique CMSR data only when needed.