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Danville, CA, United States of America

Allan Rosencwaig

USPTO Granted Patents = 57

Average Co-Inventor Count = 2.0

ph-index = 34

Forward Citations = 3,498(Granted Patents)

Forward Citations (Not Self Cited) = 3,375(Dec 10, 2025)

Inventors with similar research interests:

Location History:

Piscataway, NJ (US) (1976)
Daville, CA (US) (2004)
Danville, CA (US) (1981 - 2014)

Company Filing History:

Therma-wave, Inc.

Kla Tencor Corporation

Therma-wave Partners

4. 1 out of 3,975

The United States of America As Represented by the United States

Arist Instruments, Inc.

6. 4 out of 832,880

Other

patents

Years Active: 1976-2014

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Areas of Expertise:

Modulated Reflectance Measurement

Thin Film Optical Measurement

Critical Dimension Analysis

Optical Inspection Equipment

X-ray Reflectometry

Thermal Wave Measurements

Ellipsometry

Optical Scatterometry

Multi-layer Thin Film Stacks

Sample Characteristic Analysis

Non-invasive Biological Analysis

Grain Size Measurement

57 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8817260 - Modulated reflectance measurement system using UV probe (2014-08-26),

2. 7646486 - Modulated reflectance measurement system using UV probe (2010-01-12),

3. 7362441 - Modulated reflectance measurement system using UV probe (2008-04-22),

4. 7286243 - Beam profile complex reflectance system and method for thin film and critical dimension measurements (2007-10-23),

5. 7248375 - Critical dimension analysis with simultaneous multiple angle of incidence measurements (2007-07-24),

6. 7126690 - Modulated reflectance measurement system using UV probe (2006-10-24),

7. 7068370 - Optical inspection equipment for semiconductor wafers with precleaning (2006-06-27),

8. 7061627 - Optical scatterometry of asymmetric lines and structures (2006-06-13),

9. 6972852 - Critical dimension analysis with simultaneous multiple angle of incidence measurements (2005-12-06),

10. 6930771 - Optical inspection equipment for semiconductor wafers with precleaning (2005-08-16),

11. 6922244 - Thin film optical measurement system and method with calibrating ellipsometer (2005-07-26),

12. 6894781 - Monitoring temperature and sample characteristics using a rotating compensator ellipsometer (2005-05-17),

13. 6842259 - Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements (2005-01-11),

14. 6829057 - Critical dimension analysis with simultaneous multiple angle of incidence measurements (2004-12-07),

15. 6813034 - Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements (2004-11-02),

Title: The Innovative Journey of Allan Rosencwaig

Introduction: Allan Rosencwaig, a distinguished inventor hailing from Danville, CA (US), has made significant contributions to the field of innovations with his groundbreaking ideas and inventions.

Latest Patents: Allan Rosencwaig holds several patents in various technological domains, showcasing his versatility and creativity in inventing new solutions to complex problems.

Career Highlights: Throughout his illustrious career, Allan Rosencwaig has been at the forefront of technological advancements, revolutionizing industries with his inventive spirit and forward-thinking approach.

Collaborations: Allan Rosencwaig has collaborated with leading research institutions, universities, and companies to bring his ideas to life, fostering a culture of innovation and excellence in the process.

Conclusion: Allan Rosencwaig's passion for innovation and his relentless pursuit of excellence have solidified his position as a visionary inventor, leaving a lasting impact on the world of inventions and paving the way for future innovators to follow in his footsteps.

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