San Jose, CA, United States of America

Alireza Shahdoost Moghadam

This inventor holds 4 USPTO granted patents. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation, Other. Active years: 2008-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Alireza Shahdoost Moghadam. Retrieved from https://idiyas.com/inventor/alireza-shahdoost-moghadam

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 75.0

Average Co-Inventor Count = 3.1

ph-index = 3

Forward Citations = 66(Granted Patents)


Company Filing History:


Years Active: 2008-2014

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4 patents (USPTO):Explore Patents

Title: Alireza Shahdoost Moghadam: Innovator in Surface Defect Detection

Introduction

Alireza Shahdoost Moghadam is a prominent inventor based in San Jose, California, renowned for his significant contributions to the field of surface defect detection. With four patents to his name, he demonstrates a keen ability to pioneer innovative solutions that enhance the efficiency and accuracy of substrate inspection.

Latest Patents

Moghadam's recent patents showcase his expertise in complex detection systems. One of his latest inventions, "Detecting and Classifying Surface Defects with Multiple Radiation Collectors," involves a sophisticated system designed to detect and classify defects on a substrate's surface. This system utilizes multiple radiation collectors, with a first targeting assembly directing radiation onto the substrate. The first collecting assembly captures specularly reflected radiation to produce signals, while subsequent assemblies gather scattered radiation caused by defects and micro-roughness. A processor analyzes these signals, enabling precise detection and classification of defects.

Another noteworthy patent, "Substrate Edge Inspection," features an apparatus for inspecting substrate edges. This invention employs a light source to create a semi-annular scanning beam that directs onto the edge of the substrate. A parabolic surface then directs the specularly reflected light to a detector, which generates signals for defect analysis. This innovative approach significantly improves edge inspection processes.

Career Highlights

Alireza has had a noteworthy career, with significant experience at Kla-Tencor Corporation, where he applied his expertise in technology and innovation to drive advancements in substrate inspection. His role involved tackling challenging problems and developing cutting-edge solutions that benefitted various industries reliant on quality substrate manufacturing.

Collaborations

Throughout his career, Moghadam has collaborated with distinguished professionals, including Steven W. Meeks and Mahendra Prabhu Ramachandran. These collaborations have further fueled his creative prowess and contributed to the successful development of his patents.

Conclusion

Alireza Shahdoost Moghadam is a driving force in the realm of innovations focused on substrate defect detection. His four patents reflect a commitment to improving manufacturing processes through advanced technology. With a solid foundation in engineering and collaboration with esteemed colleagues, Moghadam continues to be a valuable asset to the field of industrial inspection and innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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