Yokohama, Japan

Akira Takada

This inventor holds 25 USPTO granted patents and 4 published patent applications and 1 EPO patent, primarily in Optical Measurement Technologies. Top assignees: Mitutoyo Corporation, Asahi Glass Company, Limited, Kabushiki Kaisha Topcon. Active years: 1997-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Akira Takada. Retrieved from https://idiyas.com/inventor/akira-takada

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 25 

% Patents Active = 84.0


Average Co-Inventor Count = 3.1

ph-index = 8

Forward Citations = 215(Granted Patents)


Location History:

  • Kawasaki, JP (2003 - 2005)
  • Itabashi-ku, JP (2007)
  • Tokyo, JP (2000 - 2019)
  • Yokohama, JP (1997 - 2022)

Company Filing History:


Years Active: 1997-2025

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Areas of Expertise:
Optical Measurement
Interferometer Calibration
Hardness Testing
Image Measuring
Machine Vision
Optical Fiber
Glass Composition
Abrasion Resistant Glass
Photomask Inspection
Edge Detection
Signal Formation
25 patents (USPTO):Explore Patents

Title: Innovations by Akira Takada: A Profile of an Influential Inventor in Yokohama

Introduction

Akira Takada, a prolific inventor based in Yokohama, Japan, has made significant contributions to the field of imaging and measurement technologies. With an impressive portfolio of 24 patents, Takada has established himself as a leader in innovation and invention.

Latest Patents

Among his latest breakthroughs are two notable patents:

1. **Image Measuring Method and Apparatus** - This innovative method utilizes an image measuring device to accurately measure the dimensions of objects captured in images. The procedure involves measuring a standard reference object, calculating preset values, and correcting measurements to ensure accuracy.

2. **Method of Calibrating Interferometer and Interferometer Using the Same** - This calibration method enhances the accuracy of waveform distortion in interferometers by generating interference signals through voltage variation, with the results being analyzed via Fourier transforms to obtain precise frequency information.

Career Highlights

Akira Takada has been associated with prominent companies such as Mitutoyo Corporation and Asahi Glass Company, Limited, where he honed his skills in developing advanced measurement and calibration technologies. His experience at these renowned organizations has significantly influenced his innovative endeavors and patent filings.

Collaborations

Throughout his career, Takada has collaborated with distinguished colleagues in the field, including Gyokubu Cho and Makoto Kaieda. These partnerships have fostered an environment of creativity and knowledge sharing, leading to groundbreaking advancements in technology.

Conclusion

Akira Takada's contributions to the realm of inventions and patents underscore his commitment to advancing measurement technologies. His work not only enhances precision in imaging but also exemplifies the spirit of innovation that drives progress across industries. With a robust number of patents and impactful collaborations, Takada continues to inspire future inventors and researchers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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