The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Jul. 13, 2015
Applicant:

Mitutoyo Corporation, Kanagawa, JP;

Inventors:

Gyokubu Cho, Kanagawa, JP;

Akira Takada, Yokohama, JP;

Takashi Hanamura, Kawasaki, JP;

Takuho Maeda, Kawasaki, JP;

Assignee:

MITUTOYO CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 5/232 (2006.01); G06T 11/60 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23229 (2013.01); G01B 21/04 (2013.01); G06T 11/60 (2013.01); H04N 5/23293 (2013.01);
Abstract

An image measuring apparatus is configured such that an image of a measured object placed on a stage is captured by a camera, the captured image is displayed on, a captured image display screen, and determination results based on results of a measurement are displayed in an overview list separately from the captured image of the measured object. The image measuring apparatus includes an individual determination results display region displaying individual determination results for each measurement position; and an overall determination results display region displaying overall determination results for the measured object as a unit. The image measuring apparatus is configured to display the individual determination results and the overall determination results together.


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