The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2022
Filed:
Dec. 20, 2016
Mitutoyo Corporation, Kanagawa, JP;
Gyokubu Cho, Kanagawa, JP;
Koichi Komatsu, Kawasaki, JP;
Akira Takada, Yokohama, JP;
Hiroyuki Yoshida, Kawasaki, JP;
Takashi Hanamura, Kawasaki, JP;
Takuho Maeda, Kawasaki, JP;
Makoto Kaieda, Miyazaki, JP;
Isao Tokuhara, Hiroshima, JP;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device; a standard reference dimension input inputting a dimension of the standard reference object specified by a device other than the image measuring device; a preset value calculation calculating a preset value from the dimension of the measured standard reference object and from a dimension of the standard reference object measured by a predetermined measurement tool; a measurement measuring a dimension of a measured object other than the standard reference object using the image measuring device; and a correction correcting the dimension of the measured object other than the standard reference object measured by the image measuring device.