Location History:
- Kawasaki, JP (2018)
- Hiroshima, JP (2022)
Company Filing History:
Years Active: 2018-2022
Title: Isao Tokuhara: Innovator in Image Measuring Technology
Introduction
Isao Tokuhara is a notable inventor based in Hiroshima, Japan. He has made significant contributions to the field of image measuring technology, holding a total of 2 patents. His work focuses on enhancing the accuracy and efficiency of image measurement processes.
Latest Patents
Tokuhara's latest patents include an innovative image measuring method and apparatus. This method utilizes an image measuring device to measure the dimensions of a measured object from an image captured by an image capturer. The process involves several steps, including standard reference object measurement, inputting a standard reference dimension, calculating a preset value, measuring the dimension of the measured object, and correcting the measurement.
Another significant patent is the edge detection bias correction value calculation method. This method measures the distance between a first set of edges that exhibit opposite changes between light and dark. A bias correction value is calculated based on the difference between the measured value and the true value. This value is then used to correct detection points in various directions, enhancing the accuracy of edge detection.
Career Highlights
Tokuhara is currently employed at Mitutoyo Corporation, a leading company in precision measurement technology. His work at Mitutoyo has allowed him to develop and refine his innovative image measuring techniques, contributing to the company's reputation for excellence in measurement solutions.
Collaborations
Throughout his career, Tokuhara has collaborated with esteemed colleagues such as Gyokubu Cho and Koichi Komatsu. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies in the field of image measurement.
Conclusion
Isao Tokuhara's contributions to image measuring technology exemplify his dedication to innovation and precision. His patents reflect a commitment to improving measurement techniques, making a lasting impact in the industry.