The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Sep. 02, 2016
Mitutoyo Corporation, Kanagawa, JP;
MITUTOYO CORPORATION, Kanagawa, JP;
Abstract
A hardness tester includes a memory storing, as a parts program, definitions of measurement conditions including a coordinate system and test position defined with respect to an image of a standard reference sample; a pattern searcher performing a pattern searching process, with reference to a plurality of samples to be measured, using a pattern image based on the image of the standard reference sample, and detecting a number of samples having a shape identical to that of the standard reference sample, as well as a position and angle of the samples having the identical shape; a pattern definer defining a coordinate system and test position for each of the samples having the identical shape based on the position and angle of each of the samples having the identical shape; and a measurer measuring the hardness of the samples for which the coordinate system and test position have been defined.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile