This inventor holds 32 USPTO granted patents, primarily in Plasma Processing Technology. Top assignees: Alps Electric Co., Ltd., Frontec Incorporated, Seiko Epson Corporation. Active years: 1983-2009.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Akira Nakano. Retrieved from https://idiyas.com/inventor/akira-nakano
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 81.3
Average Co-Inventor Count = 2.5
ph-index = 11
Forward Citations = 529(Granted Patents)
Location History:
- Meguro-ku, Tokyo-to, JP (1983 - 1990)
- Furukawa, JP (1996 - 2001)
- Miyagi-ken, JP (1999 - 2009)
Company Filing History:
19 out of 4,048 Alps Electric Co., Ltd.
9 out of 37 Frontec Incorporated
1 out of 34,238 
Seiko Epson Corporation
4. 11 out of 834,453 patents
Other
where one patent can have more than one assignee
Years Active: 1983-2009
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Areas of Expertise:
Plasma Processing Apparatus
Liquid-Crystal Display
Flexible Printed Circuit Board
Electro-Optical Device
Performance Evaluation
Impedance Measurement Tool
Plasma Treatment Equipment
Sputtering Method
Matching Circuit
High Frequency Power Supply
Electrostatic Charge Removal
Thin-Film Transistor
32 patents (USPTO):Explore Patents
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Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Akira Nakano. Retrieved from https://idiyas.com/inventor/akira-nakano
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]