Company Filing History:
Years Active: 2001-2017
Title: Innovations of Akira Kakizawa: Pioneering Electrical Circuit Testing
Introduction
Akira Kakizawa, based in Phoenix, AZ, has emerged as a leading inventor with a total of 13 patents to his name. His innovative work, particularly in the field of electrical circuits, showcases his invaluable contributions to technology and testing methodologies.
Latest Patents
One of Kakizawa's most notable recent inventions is the "Alternating Current Coupled Electronic Component Test System and Method." This invention addresses the testing of electronic package components by employing a capacitive element configured in series with the component. The system also involves path resistance that is electrically coupled to the capacitive element, allowing for effective measurements. A driver is incorporated to charge the capacitive element, while a voltage detector measures the voltage across the capacitive element to assess the condition of the electronic package component accurately.
Career Highlights
Kakizawa's career at Intel Corporation has been marked by a strong commitment to innovation in electronic testing and circuit design. His expertise has contributed significantly to enhancing the reliability and efficiency of various electronic components.
Collaborations
Throughout his career, Kakizawa has collaborated with notable colleagues, including Kevin M. Connolly and Jung S. Kang. Working alongside such talented individuals has fostered an environment of innovation and creativity, leading to groundbreaking advancements in their field.
Conclusion
Akira Kakizawa's innovative contributions, particularly in the realm of electronic component testing, reflect his dedication to advancing technology. With his impressive patent portfolio and collaborative efforts, he continues to influence the industry and inspire future innovations at Intel Corporation.