The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2006
Filed:
Dec. 15, 2005
Applicants:
Akira Kakizawa, Phoenix, AZ (US);
Ronald W. Swartz, Granite Bay, CA (US);
Inventors:
Akira Kakizawa, Phoenix, AZ (US);
Ronald W. Swartz, Granite Bay, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and an apparatus for testing transmitter and receiver have been disclosed. One embodiment of the apparatus includes a plurality of multiplexers to select one of a positive and a negative transmitter pins, and a first comparator to compare a voltage of the selected pin with a first reference voltage to determine whether there is leakage at the selected pin. Other embodiments are described and claimed.
Kakizawa, Akira. (2006). Method and an apparatus for testing transmitter and receiver (U.S. Patent No. 7154288). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7154288
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile