The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2004
Filed:
Jan. 09, 2001
Applicant:
Inventors:
Akira Kakizawa, Phoenix, AZ (US);
Erik T. Fought, Chandler, AZ (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract
Hardware or software to test a circuit with a set of functional vectors. The invention compares expected results of functional vectors with the actual results of the test circuit. If there is a miscompare, a recursive comparison is done prior to the first clock cycle of the miscompare.
Kakizawa, Akira. (2004). Method and apparatus for failure detection utilizing functional test vectors and scan mode (U.S. Patent No. 6725406). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6725406
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile