Hiratsuka, Japan

Akio Yamamoto

USPTO Granted Patents = 48 

 

Average Co-Inventor Count = 3.0

ph-index = 14

Forward Citations = 505(Granted Patents)


Location History:

  • Hadano, JP (1990 - 1991)
  • Kudamatsu, JP (1985 - 1992)
  • Sagamihara, JP (1994)
  • Yokohama, JP (1987 - 2012)
  • Hiratsuka, JP (1997 - 2014)
  • Kyoto, JP (2015)
  • Tokyo, JP (1985 - 2023)

Company Filing History:


Years Active: 1985-2023

where 'Filed Patents' based on already Granted Patents

48 patents (USPTO):

Title: Akio Yamamoto: Innovator in Charged Particle Beam Technology

Introduction: Akio Yamamoto, based in Hiratsuka, Japan, is a prolific inventor with an impressive portfolio of 48 patents. His contributions to the field of charged particle beam technology have significantly advanced methodologies, particularly in calibration methods and measurement devices.

Latest Patents: Among Akio Yamamoto's recent innovations are a charged particle beam device and a charged particle beam device calibration method. These devices are designed to correct the influence of characteristic variation and noise with high accuracy. The control units within the device execute a two-step calibration process: first, correcting variations between channels in detectors without emitting a primary electron beam, and second, addressing variations in scintillators when the beam is active. Another notable patent involves a measurement device that integrates a photoelectric conversion element alongside a signal processing part that analyzes detected pulses including both dark and signal pulses. This processing unit utilizes a pre-acquired dark pulse amplitude distribution to perform amplitude discrimination effectively.

Career Highlights: Akio Yamamoto has had a distinguished career with notable companies, including Hitachi, Ltd. and Renesas Technology Corporation. His work at these organizations has been vital in driving forward the technological advancements associated with particle beam applications.

Collaborations: Throughout his career, Akio has collaborated with talented individuals such as Yutaka Igarashi and Wen Zheng Li. These collaborations have enhanced his research and development efforts, resulting in innovative solutions that address complex challenges in his field.

Conclusion: Akio Yamamoto's contributions to charged particle beam technology exemplify the essence of innovation in the modern era. His patents not only reflect his expertise but also his commitment to enhancing technology for practical applications in various industries. With his continued work, he remains a key figure in the advancement of precision measurement and calibration technologies.

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