The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 2013

Filed:

Jan. 25, 2012
Applicants:

Yusaku Katsube, Yokohama, JP;

Kosuke Tsuiji, Kanagawa, JP;

Yutaka Igarashi, Yokohama, JP;

Akio Yamamoto, Hiratsuka, JP;

Inventors:

Yusaku Katsube, Yokohama, JP;

Kosuke Tsuiji, Kanagawa, JP;

Yutaka Igarashi, Yokohama, JP;

Akio Yamamoto, Hiratsuka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/10 (2006.01); H04K 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to accurately set a frequency characteristic of a filter integrated in a semiconductor integrated circuit. A semiconductor integrated circuit includes a filter circuit, a cutoff frequency calibration circuit, and a Q-factor calibration circuit. The cutoff frequency calibration circuit adjusts cutoff frequency of the filter circuit to a desired value by adjusting capacitance components of the filter circuit. After adjustment of the cutoff frequency of the filter circuit by the cutoff frequency calibration circuit, the Q-factor calibration circuit adjusts the Q factor of the filter circuit to a desired value by adjusting a resistance component of the filter circuit.


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