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USPTO Data Jan 1 1976 - Oct 20 2026
38 Patents
#56 in Fremont, CA
#2,133 in California
#9,033 in US
#17,860 in the World
Yield Engineering Systems, Inc.
Forward Citations = 66
57 inventors:
Fremont, CA, United States of America
Yield Engineering Systems, Inc.
EPO Patents = 3
Trademarks = 11
Forward Citations = 66
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57 inventors (with patents filed for the assignee):
M Ziaul Karim (12 out of 29 patents)
William A Moffat (12 out of 14 patents)
Kenneth M Sautter (7 out of 24 patents)
4. Craig Walter McCoy (6 out of 6 patents)
5. Lei Jing (4 out of 9 patents)
6. Christopher F Lane (4 out of 102 patents)
7. Kang Song (3 out of 4 patents)
8. Dragan Cekic (3 out of 3 patents)
9. Craig Walter Mccoy (3 out of 3 patents)
10. Christopher T Lane (3 out of 3 patents)
11. Gabriel Ormonde (2 out of 4 patents)
12. Ramakanth Alapati (2 out of 26 patents)
13. Randy Hall (2 out of 4 patents)
14. Rajeev Bajaj (2 out of 113 patents)
15. Peter Krotov (2 out of 7 patents)
Core Competencies:
Coating Removal
Substrate Cleaning
Polymer Processing
Solder Reflow
Plasma Cleaning
Batch Processing Oven
Dielectric Liners
Fluid Vaporizers
Ultrasonics Cleaning
Adhesion Strength
Vacuum Chamber
Thermal Management
38 patents:
Company Overview
Yield Engineering Systems, Inc. is a technology company based in Fremont, California, specializing in advanced manufacturing solutions for the semiconductor and microelectronics industries. The company focuses on developing innovative equipment and processes that enhance the efficiency and effectiveness of semiconductor fabrication. With a commitment to research and development, Yield Engineering Systems aims to address the evolving challenges in the semiconductor landscape, providing cutting-edge solutions that drive technological advancement.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Yield Engineering Systems, Inc.. Retrieved from https://idiyas.com/company/yield-engineering-systems
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
3 patents (EPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]