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Yongin, South Korea

Unitest Inc.

USPTO Granted Patents = 30

% Expired Patents = 16.7

Forward Citations = 47

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30 inventors (with patents filed for the assignee):

Eui Won Lee (6 out of 6 patents)

Hyo Jin Oh (5 out of 5 patents)

Jong Koo Kang (5 out of 6 patents)

4. Ho Sang You (4 out of 4 patents)

5. Sun Whan Kim (4 out of 4 patents)

6. Bong Hwan Kim (3 out of 9 patents)

7. Dae Kyoung Kim (3 out of 3 patents)

8. Woo Sik Jung (2 out of 3 patents)

9. Young Myoun Han (2 out of 2 patents)

10. Sang Sig Lee (2 out of 2 patents)

11. Jong Bok Kim (2 out of 6 patents)

12. Eun Ji Shin (1 out of 48 patents)

13. Byung Soo Yoo (1 out of 1 patent)

14. Seong Ki No (1 out of 1 patent)

15. Jae Suk Huh (1 out of 1 patent)

Core Competencies:

Probe Card

Wafer Testing

Solid State Drive

Memory Tester

Burn-In Test

FPGA

Failure Detection

Test Board Unit

Storage Tester

Data Acquisition

Semiconductor Device

Error Generation

30 patents: Sort by Forward Citations

1. 12644550 - Automatic connector for supplying utility (2026-06-02),

2. 12601782 - Probe card holder for wafer testing (2026-04-14),

3. 11031091 - Apparatus and method for measuring round-trip time of test signal using programmable logic (2021-06-08),

4. 10871288 - Sealed plasma melting furnace for treating low- and intermediate-level radioactive waste (2020-12-22),

5. 10060969 - Test board unit and apparatus for testing a semiconductor chip including the same (2018-08-28),

6. 9714977 - Burn-in test system and method (2017-07-25),

7. 9613718 - Detection system for detecting fail block using logic block address and data buffer address in a storage tester (2017-04-04),

8. 9459302 - Device under test tester using redriver (2016-10-04),

9. 9411700 - Storage tester capable of individual control for a plurality of storage (2016-08-09),

10. 9378846 - Non-mounted storage test device based on FPGA (2016-06-28),

11. 9378845 - System for simultaneously determining memory test result (2016-06-28),

12. 9312030 - Apparatus and method for acquiring data of fast fail memory (2016-04-12),

13. 9245613 - Storage interface apparatus for solid state drive tester (2016-01-26),

14. 9197212 - Apparatus and method for correcting output signal of FPGA-based memory test device (2015-11-24),

15. 9171643 - Solid state drive tester (2015-10-27),

Unitest Inc. is a South Korean company based in Yongin, specializing in advanced testing and measurement solutions. The organization focuses on developing innovative technologies for various industries, including telecommunications, automotive, and electronics. Unitest is dedicated to enhancing product quality and performance through its state-of-the-art testing equipment and software solutions. By leveraging its expertise in precision measurement, the company aims to support clients in achieving operational excellence and compliance with industry standards.

Profile summary based on public USPTO records.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

30 Patents

#13 in Yongin

#454 in South Korea

#21,853 in the World

Yongin, South Korea

Unitest Inc.

Forward Citations = 47

30 inventors:

Eui Won Lee (6 out of 6 patents)

Hyo Jin Oh (5 out of 5 patents)

Jong Koo Kang (5 out of 6 patents)

4. Ho Sang You (4 out of 4 patents)

5. Sun Whan Kim (4 out of 4 patents)

Please report any incorrect information to [email protected]

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