For the Inventor, By the Inventor

Enter assignee name

Yongin, South Korea

Unitest Inc.

USPTO Granted Patents = 30

% Expired Patents = 16.7

Forward Citations = 47

Loading Chart...

Loading Chart...

30 inventors (with patents filed for the assignee):

Eui Won Lee (6 out of 6 patents)

Hyo Jin Oh (5 out of 5 patents)

Jong Koo Kang (5 out of 6 patents)

4. Ho Sang You (4 out of 4 patents)

5. Sun Whan Kim (4 out of 4 patents)

6. Bong Hwan Kim (3 out of 9 patents)

7. Dae Kyoung Kim (3 out of 3 patents)

8. Woo Sik Jung (2 out of 3 patents)

9. Young Myoun Han (2 out of 2 patents)

10. Sang Sig Lee (2 out of 2 patents)

11. Jong Bok Kim (2 out of 6 patents)

12. Eun Ji Shin (1 out of 47 patents)

13. Byung Soo Yoo (1 out of 1 patent)

14. Seong Ki No (1 out of 1 patent)

15. Jae Suk Huh (1 out of 1 patent)

30 patents: Sort by Forward Citations

1. 12644550 - Automatic connector for supplying utility (2026-06-02),

2. 12601782 - Probe card holder for wafer testing (2026-04-14),

3. 11031091 - Apparatus and method for measuring round-trip time of test signal using programmable logic (2021-06-08),

4. 10871288 - Sealed plasma melting furnace for treating low- and intermediate-level radioactive waste (2020-12-22),

5. 10060969 - Test board unit and apparatus for testing a semiconductor chip including the same (2018-08-28),

6. 9714977 - Burn-in test system and method (2017-07-25),

7. 9613718 - Detection system for detecting fail block using logic block address and data buffer address in a storage tester (2017-04-04),

8. 9459302 - Device under test tester using redriver (2016-10-04),

9. 9411700 - Storage tester capable of individual control for a plurality of storage (2016-08-09),

10. 9378846 - Non-mounted storage test device based on FPGA (2016-06-28),

11. 9378845 - System for simultaneously determining memory test result (2016-06-28),

12. 9312030 - Apparatus and method for acquiring data of fast fail memory (2016-04-12),

13. 9245613 - Storage interface apparatus for solid state drive tester (2016-01-26),

14. 9197212 - Apparatus and method for correcting output signal of FPGA-based memory test device (2015-11-24),

15. 9171643 - Solid state drive tester (2015-10-27),

UNITEST INC. is a leading provider of software testing solutions. With a focus on quality assurance and test automation, we help businesses deliver reliable and high-performance software. Our innovative products and services have been trusted by clients worldwide for over a decade. Visit our website to learn more.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Sep 15 2026

30 Patents

#13 in Yongin

#457 in South Korea

#21,816 in the World

Yongin, South Korea

Unitest Inc.

Forward Citations = 47

30 inventors:

Eui Won Lee (6 out of 6 patents)

Hyo Jin Oh (5 out of 5 patents)

Jong Koo Kang (5 out of 6 patents)

4. Ho Sang You (4 out of 4 patents)

5. Sun Whan Kim (4 out of 4 patents)

Please report any incorrect information to [email protected]

Loading…