The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Aug. 07, 2014
Applicant:

Unitest Inc., Gyeonggi-do, KR;

Inventor:

Young Myoun Han, Gangwon-do, KR;

Assignee:

UNITEST INC., Yongin-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/56 (2006.01); G11C 29/12 (2006.01); G06F 11/273 (2006.01); G11C 16/00 (2006.01);
U.S. Cl.
CPC ...
G11C 29/1201 (2013.01); G06F 11/273 (2013.01); G11C 29/56004 (2013.01); G11C 16/00 (2013.01);
Abstract

A non-mounted storage test device based on FPGA includes a processor unit for performing enumeration and configuration for device, creating a scenario for test and performing test; a device driver unit for managing storage device; a data engine unit for generating pattern data for test and performing test; a system memory interface unit for receiving data for test and storing test result; a monitoring unit for monitoring packet; a DMA driver/address translation unit for performing DMA operation and transmitting Memory Read Request to Root Complex; a message input/output unit for transmitting to the data engine unit and the device driver unit; a switch unit for constituting DUT unit; a storage-in DUT unit as device under test which is storage for direct interface to PCIe including HBA; and a memory unit for storing data for test and record generated between tasks.


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