The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Jan. 08, 2024
Applicant:

Unitest Inc, Yongin-si, KR;

Inventor:

Dae Kyoung Kim, Yongin-si, KR;

Assignee:

UNITEST INC, Yongin-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2891 (2013.01); G01R 1/073 (2013.01);
Abstract

Proposed is a probe card holder for wafer testing including a first body part () provided with a probe card () and through guide holes () vertically formed around the probe card (), a second body part () provided with a wafer chuck () on which a wafer is seated and a magnet holder () corresponding to the guide hole (), a weight ring () provided with a magnet chuck () that is inserted into the guide hole () and fixed with the magnet holder () by magnetic force, and assembled with the second body part () at a top of the first body part (), and a clamping part () provided between the first body part () and the weight ring () to hold spacing between the first body part () and the weight ring ().


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