The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2021
Filed:
May. 11, 2018
Applicant:
Unitest Inc., Yongin-si, KR;
Inventor:
Ho Sang You, Seoul, KR;
Assignee:
UNITEST INC., Yongin-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/56 (2006.01); H03K 19/177 (2020.01);
U.S. Cl.
CPC ...
G11C 29/56012 (2013.01); G11C 29/56004 (2013.01); H03K 19/177 (2013.01);
Abstract
An apparatus for measuring round-trip time of a test signal using a programmable logic device comprises a pattern generator generating a test signal and measuring a round-trip time of the test signal, a programmable logic device of which internal circuits are configured to transmit the test signal in a predetermined manner, and bidirectional bus lines connecting the pattern generator and the programmable logic device. The round-trip time of the test signal is measured by a time difference between a starting time at which the pattern generator outputs the test signal and an arrival time at which the test signal is fed back to the pattern generator.