The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2016

Filed:

Jul. 30, 2014
Applicant:

Unitest Inc., Gyeonggi-do, KR;

Inventor:

Ho Sang You, Seoul, KR;

Assignee:

UNITEST INC., Yongin-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/10 (2006.01); G11C 29/12 (2006.01); G11C 29/36 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G11C 29/12015 (2013.01); G11C 29/36 (2013.01);
Abstract

A system for test plural memories simultaneously includes a pattern generation part which generates a pattern signal for testing and transmits the signal to the memories, a delay part which receives data through a first data line from a first memory device that is disposed in a closest position from the delay part and a second data line from a second memory device that is disposed in a farthest position from the delay part, and a determination part which determines the result of testing by comparing the data from the first memory device and the second memory device. The delay part output the first data and the second data to the determination part simultaneously.


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