Vourles, France

Tiama


USPTO Granted Patents = 34

% Expired Patents = 11.8


Trademarks = 2

Forward Citations = 23

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29 inventors (with patents filed for the assignee):

goldMedal Olivier Colle (12 out of 14 patents)

silverMedal Marc Leconte (10 out of 18 patents)

bronzeMedal Laurent Cosneau (7 out of 7 patents)

4.  Michel Ollivier (5 out of 7 patents)

5.  Lubin Fayolle (4 out of 6 patents)

6.  Guillaume Bathelet (4 out of 6 patents)

7.  Marc Gerard (3 out of 3 patents)

8.  Adrien Chabert (2 out of 2 patents)

9.  Pascal Fillon (2 out of 2 patents)

10.  Etienne Leprat (2 out of 3 patents)

11.  Jean-François Garin (2 out of 5 patents)

12.  Arnaud Brosse (2 out of 2 patents)

13.  Pierre-Yves Solane (2 out of 2 patents)

14.  Julien Fouilloux (1 out of 2 patents)

15.  Philippe Michel (1 out of 1 patent)


Core Competencies:
Optical Inspection
Glass Containers
Dimensional Control
Defect Detection
Kinematic Measurement
Polarimetric Camera
Translucent Materials
Surface Defects
Container Geometry
X-ray Measurement
Optoelectronic Process
Hot Hollow Articles

34 patents:

Company Overview
Tiama is a prominent player in the glass manufacturing industry, specializing in advanced inspection and quality control solutions. The company develops innovative technologies that enhance production efficiency and product quality for glass containers. With a strong focus on automation and digitalization, Tiama integrates cutting-edge software and hardware systems to optimize manufacturing processes. Headquartered in Vourles, France, Tiama serves a global clientele, providing tailored solutions that meet the evolving needs of the glass sector.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

Tiama USPTO Patent Assignee Logo
34 Patents

#1 in Vourles

#648 in France

#19,651 in the World

Vourles, FR
Vourles, France
Forward Citations = 23

29 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Tiama. Retrieved from https://idiyas.com/company/tiama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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