The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Apr. 21, 2020
Tiama, Vourles, FR;
Olivier Colle, Oullins, FR;
Laurent Cosneau, Soucieu-en-Jarrest, FR;
TIAMA, Saint-Genis-Laval, FR;
Abstract
An inspection line comprises: at a finish inspection station, a finish inspection installation capable of detecting without contact, by light rays, check-type defects in the neck of the containers; at a base inspection station, a base inspection installation capable of detecting without contact, by light rays, check-type defects in the base of the containers; and at a radiographic measuring station, a radiographic installation for automatically measuring linear dimensions of at least one region to be inspected of containers. The three installations are each arranged at stations distinct from each other along a trajectory of displacement of the containers. In each installation, a section of the transport device ensures, in the inspection area of the installation, the transport of the containers along a rectilinear portion of the trajectory (T) in a horizontal conveying plane (Pc) perpendicular to the central axis of the containers.