The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2022

Filed:

Oct. 23, 2020
Applicant:

Tiama, Vourles, FR;

Inventors:

Lubin Fayolle, Brignais, FR;

Marc Leconte, Loire sur Rhone, FR;

Michel Ollivier, Acigne, FR;

Assignee:

TIAMA, Vourles, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/00 (2011.01); G06T 7/00 (2017.01); G01N 21/90 (2006.01); G01B 11/30 (2006.01); H04N 5/225 (2006.01); H04N 5/232 (2006.01); G01N 21/88 (2006.01); G06T 7/50 (2017.01);
U.S. Cl.
CPC ...
G01N 21/9054 (2013.01); G01B 11/303 (2013.01); G06T 7/0004 (2013.01); H04N 5/2256 (2013.01); H04N 5/23238 (2013.01); G01N 2021/8887 (2013.01); G01N 2201/102 (2013.01); G06T 7/50 (2017.01);
Abstract

An inspection device which is compatible with in-line inspection of containers and reliably determines the presence or not of a defect of a container, has a lighting system arranged above an installation zone and being capable of providing an incident light beam, an image sensor connected to an image-analysis unit, and an optical system with a first primary reflection surface arranged above the installation zone and interposed between the installation zone and the sensor for forming on the sensor an image of a container ring surface to be inspected. Also included is a second primary reflection surface in the upstream field of vision of the sensor to reflect light beams, directly or indirectly in the direction of the sensor. The first and second primary reflection surfaces determine first and second portions of a downstream field of vision, which overlap in the inspection zone.


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