The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Apr. 09, 2021
Applicant:

Tiama, Saint-Genis-Laval, FR;

Inventors:

Laurent Cosneau, Soucieu-en-Jarrest, FR;

Pascal Fillon, Grezieu la Varenne, FR;

Assignee:

TIAMA, Saint-Genis-Laval, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/90 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9036 (2013.01); G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); G01N 21/9054 (2013.01); G01N 2021/8887 (2013.01);
Abstract

A station for detecting glass disease-type defects in a segment of containers includes: a non-deformable support on which the projectors and the imagers are mounted by a complete connection so as to fix beam directions of the projectors and the optical axes of the imagers; several sets of projectors each include at least six projectors whose beam direction is tangent to a cylinder with a diameter included in a determined range of diameters; an electronic system configured to inspect the containers falling within all of the ranges of diameters, such that during inspection of the containers whose segment diameter to be inspected is included in the range of diameters of a set, the electronic system ensures acquisition of at least six images of each container when it passes through the inspection area by selectively activating the at least six imagers simultaneously with the associated projectors of said set.


Find Patent Forward Citations

Loading…