The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Jul. 10, 2020
Applicant:

Tiama, Vourles, FR;

Inventors:

Marc Leconte, Loire sur Rhone, FR;

Pierre-Yves Solane, Lyons, FR;

Assignee:

TIAMA, Saint-Genis-Laval, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); G01N 21/90 (2006.01); G01N 33/38 (2006.01);
U.S. Cl.
CPC ...
G01B 11/06 (2013.01); G01N 33/386 (2013.01); G01N 21/90 (2013.01);
Abstract

A method for measuring the thickness of glass containers includes the following steps:


Find Patent Forward Citations

Leconte, Marc. (2024). Facility and method for measuring the thickness of the walls of glass containers (U.S. Patent No. 12181266). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12181266

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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